MICRO-EPSILON Messtechnik GmbH & Co. KG
23.03.2025 01:03
The thicknessGAUGE sensor systems offer precise thickness measurements of strip and sheet materials up to a thickness of 50 mm. Both C-frame systems, which can be easily inserted into the production line, and stable O-frame systems integrated into the line are available.
The flexibility with regard to the materials to be measured results from the different measuring principles on which the sensors used are based. Depending on the version, the models are equipped with laser profile sensors, laser point sensors, confocal, capacitive and eddy current sensors. Various measuring ranges and measuring widths are also available. Fixed-track measurements can be carried out at the edge of the strips, multi-track thickness measurements, fixed-track center thickness measurements or traversing thickness measurements.
Adjustments can be implemented quickly and cost-effectively. Inline thickness measurement is very easy to carry out with these turnkey systems and offers an outstanding price-performance ratio. The components are also already adjusted, calibrated and temperature-compensated, which means that thicknessGAUGE delivers extremely accurate measurement results.
In addition to powerful Micro-Epsilon sensor technology, comprehensive control and evaluation software, a mechanical traversing axis and automatic calibration are included. a powerful software package is available via the multi-touch capable panel IPC included in the scope of delivery.
The sensor system for inline profile evaluation and 3D measurement of strip and sheet material consists of an aluminum C-frame with two laser scanners, a linear axis for automatic calibration and a compact bus terminal box. In addition, there is an industrial touch PC with pre-installed software that evaluates the individual profiles of the two sensors and calculates them as a 3D point cloud or outputs them to a controller for further calculation. It is used in battery production, for example, where maximum accuracy is required.
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